DBPapers
DOI: 10.5593/sgem2012/s01.v1043

THE RIETVELD STRUCTURE REFINEMENT OF THE SELENITE GYPSUM FROM VALEA REA (ROMANIA) USING X-RAY POWDER DIFFRACTION DATA

G. ADRIAN BRANOIU
Wednesday 1 August 2012 by Libadmin2012

References: 12th International Multidisciplinary Scientific GeoConference, www.sgem.org, SGEM2012 Conference Proceedings/ ISSN 1314-2704, June 17-23, 2012, Vol. 1, 363 - 368 pp

ABSTRACT

The crystal structure of selenite gypsum from Valea Rea (Buzau County, Romania) has
been refined to Rwp and GOF indices of 2.062 and 1.10%, respectively, using X-Ray
powder diffraction data and the Rietveld method. The Rietveld refinements were carried
out using the computer program Diffracplus TOPAS 4.1 (Bruker AXS). The pseudo-
Voigt (pV) profile function was used for the fit of the peaks. The Rietveld refinement
using X-Ray powder diffraction data of selenite gypsum sample in space group I12/a1
(No.15), a=6.523Å, b=15.202Å, c=5.667Å, β=118.506º, Z=4, confirm the basic gypsum
structure.

Keywords: crystalline structure, selenite gypsum, X-ray powder diffraction, Rietveld
refinement

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