DBPapers

A SYNTETHIC SEISMIC REFLECTION DATA, PROCESSED WITH NEW METHOD; COMMON REFLECTION SURFACE STACK

AUTHOR/S: M. SOLEIMANI, I. PIRUZ
Sunday 1 August 2010 by Libadmin2007

7th International Scientific Conference - SGEM2007, www.sgem.org, SGEM2007 Conference Proceedings/ ISBN: 954-918181-2, June 11-15, 2007

ABSTRACT

A standard imaging method in seismic data processing is the simulation of a
zero offset section from seismic reflection data. In traditional imaging methods,
e. g. NMO/DMO/stack, an accurate macro velocity model is needed. Common
reflection surface (CRS) stack is a new data driven method, introduced in recent
years which remove the necessity of making this model and just use the surface
velocity to simulate zero offset section (2D) or volume (3D). In this article, we
drive the CRS stacking on a synthetic data to obtain zero offset section with
high signal-to-noise (S/N) ratio. With CRS stack, we make use of redundancy
of seismic multi coverage data to do this. At the same time, the processes
extracts travel time information from the data in the form of a number of so
called kinematic wave field attributes assigned to each considered zero offset
sample. These parameters are normal wave, normal incidence point (NIP) wave
and incidence angle. In this way, we defined the stacking surfaces that fit best
to actual events in the multi coverage data set by means of coherency analysis.
So a coherency section and a section of each of three attributes obtained which
define the stacking operator. Optionally, a subsequent optimization algorithm
performed to refine these parameters. At the end, we observe an increased S/N
ratio and an improved continuity along the events in the zero offset section,
without loss of lateral resolution.

Keywords: CRS stack, Wavefield attributes, Coherency Analysis, NIP Wave,
Normal Wave.